A novel Secondary Ion Mass Spectrometry (SIMS) instrument will be constructed to include a water cluster ion source and laser post-ionisation.
Gas cluster and water cluster ion beams will be used to reduce and control fragmentation during surface sampling and ionization. To boost sensitivity for selected analyte classes, laser post-ionisation strategies will be assessed.
With the improvements in signal to noise from both post-ionisation and high resolution mass detection, we expect that signals previously considered as ‘noise’ in other MS imaging experiments will start to reveal structural information of other, larger, analyte classes.
- University of Manchester